The X-Ray Monitor on INTEGRAL (JEM-X) will perform observations with arc minute angular resolution in the 360 keV band. The instrument is based on the same measurement principle as the two gamma-ray instruments on INTEGRAL (SPI and IBIS): sky imaging using a Coded Aperture Mask.
The instrument consists of two high pressure Microstrip gas chambers that view the sky through two coded Masks located 3.4m above the detector planes. Both Masks are identical except for the 180º rotation of the Code.
Design, Manufacturing, Testing at Subsystem level and Delivery of JEM-X Masks are responsibility the Astronomy and Space Science Group (GACE) of the University of Valencia, with the support of INTA for the Thermal Design and Tests. Main contractor for the Mask development is the Spanish company SENER. About another 10 companies have taken part in the different activities
© 2001.Grupo de Astronomía y Ciencias del Espacio/Astronomy and Space Science Group (GACE).
Instituto de Ciencia de los Materiales. Universidad de Valencia
P.O.Box 2085
E-46071 Valencia, Spain
mail to: Tirso.Velasco@uv.es
Tel: (+34) 96 398 3632 / 3229
Fax: +34) 96 398 3261